Issue 50

N. Martini et alii, Frattura ed Integrità Strutturale, 50 (2019) 471-480; DOI: 10.3221/IGF-ESIS.50.39 478 C ONCLUSIONS pplications such as, non-destructive testing, medical imaging etc., require efficient detectors, of high resolution. In this study the resolution properties of a non-destructive testing/industrial inspection CMOS sensor, in conjunction with a scintillating material that came to the spotlight once again (CaWO 4 ) was examined in order to further exploit and enhance the imaging capabilities of an integrated detector, incorporating these two modules. Experiments were carried under X-ray radiography imaging conditions, following the IEC 62220-1-1:2015 protocol. Furthermore, the detector quantum gain of the screen and the spectral compatibility was also examined for various optical sensor combinations. MTF values of the CaWO 4 screen/CMOS combination were found high across the spatial frequency range. 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