Issue 15
P. F 70 plo Pea fro loa can Mo spe fail . Fuchs et alii, F tted over th rson’s r fact m the linear ding conditio be expected reover, to ve cimens. The ure mode. In rattura ed Integ e number of or, determin correlation, w n dependen to be reflect Figure Figure Figure rify the acco analysis was Fig. 11 an rità Strutturale, drops until ed as 0.87, hich can be t material be ed in the BLC 10 : Compariso Additional to (a) 11 : Compariso design (a) 12 : Compariso design rdance betw focused on d Fig. 12 t he 15 (2011) 64-7 failure in the supported th attributed t haviour on th BT. n of the BLDT the average v n of a) the fai 1 in the BLCB n of a) the fai 2 in the BLCB een BLCBT designs 1 an light micro 3; DOI : 10.3221 BLDT. Th e method hy o the existing e other han and BLCBT alues the stand lure of design T, analyzed w lure of design T, analyzed w and BLDT d 2, expect scopy image /IGF-ESIS.15.07 e plot is rev pothesis. Ho data scatter d, only signi set-up 1 resul ard deviations 1 in the BLDT ith light micro 2 in the BLDT ith light micro a failure patt ed to exhibit s of identifie ealing a clear wever, beca on the one ficant differe ts for six PCB are indicated. (b) and b) the fa scopy. (b) and b) the fa scopy. ern analysis the most p d failure loc method cor use of existi hand and on nces in the B designs. ilure of ilure of was perform ronounced d ations are sh relation and ng discrepan the unregar LDT behav ed on the te ifferences in own. The c the cies ded iour sted the ross
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