Zhitnikov, Y. V.
-
ICF10, Honolulu (USA) 2001 - General Papers
Modelling the processes of micro-defects nucleation in thin-film interconnects of integrated circuits at electromigration
Abstract
PDF
-
ECF15, Stockolm 2004 - General Papers
Modelling and experimental verification of delamination crack growth in an air-plasma-sprayed thermal barrier coating
Abstract
PDF
This work is licensed under a
Creative Commons Attribution 3.0 License.