Gerberich, W.
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ICF6, New Delhi (India) 1984 - General Papers
Time and temperature-dependent processes affecting near threshold fatigue crack growth
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ICF10, Honolulu (USA) 2001 - General Papers
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ICF10, Honolulu (USA) 2001 - General Papers
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ICF10, Honolulu (USA) 2001 - General Papers
Mechanical properties, adhesion and fracture toughness of low-k dielectric thin films for microelectronic applications
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