Winkler, T.
-
ICF 9- Sydney, Australia- 1997 - General Papers
Fracture electronics - application of fracture mechanics to microelectronic systems and chip packages
Abstract PDF -
ECF10, Berlin 1994 - General Papers
A stochastic model stimulating the development of irregular crack patterns in thermal fatigue
Abstract PDF -
ECF11, Poitiers 1996 - General Papers
Fracture electronics - Fracture analysis of microelectronic components and chips
Abstract PDF -
ECF11, Poitiers 1996 - General Papers
The information content of quantities that describe surface crack patterns
Abstract PDF -
ICBMFF4 - General Papers
A stochastic simulation model for the damage accumulation in thermal fatigue
Abstract PDF
This work is licensed under a Creative Commons Attribution 3.0 License.