Digital Repository, ICF12, Ottawa 2009

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Stochastic Framework for Predicting Microstructurally Small Fatigue Life of AA 7075-T651
J.E. Bozek, M.G. Veilleux, J.D. Hochhalter, P.A. Wawrzynek, A.R. Ingraffea

Last modified: 2013-05-03


This paper presents a methodology for modeling fatigue life across multiple length scales with AA 7075-T651 as the proof-test material. The paper builds on the work of DDSim [1], a next generation Damage and Durability SIMulator, which was conceived to address the limitations of current life prediction methodologies for structural components. Specifically, DDSIM was designed to address arbitrary geometry and boundary conditions of the affected component, to include the stochastics of fracture and crack growth, the physics of the damage process, and to automate the simulation process. DDSim is hierarchical: Level I provides an initial approximation of component life and identifies life limiting ‘hot-spot’ locations, Level II provides a high-fidelity prediction of microstructurally large life at ‘hot-spot’ locations, and Level III provides a high-fidelity prediction of microstructurally small life.

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